Browsing by Author "Omelchenko, A. A."
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Spectral Ellipsometry as a Method of Investigation of Influence of Rapid Thermal Processing of Silicon Wafers on their Optical Characteristics
Solodukha, V. A.; Pilipenko, U. A.; Omelchenko, A. A.; Shestovski, D. V. (БНТУ, 2022)One of the possible ways of improvement of the surface properties of silicon is the solid phase recrystallization of the surface silicon layer after the chemical-mechanical polishing with application of the rapid thermal treatment with the pulses of second duration. The purpose of the given paper is investigation of influence of the rapid thermal treatment of the initial silicon ...2022-11-11