Methods and apparatus for layerwise atomic emission analysis of materials and products with nanometer resolution
| dc.contributor.author | Voropay, E. S. | en |
| dc.contributor.author | Ermalitskaia, K. F. | en |
| dc.contributor.author | Zajogin, A. P. | en |
| dc.coverage.spatial | Минск | ru |
| dc.date.accessioned | 2018-05-28T11:17:57Z | |
| dc.date.available | 2018-05-28T11:17:57Z | |
| dc.date.issued | 2013 | |
| dc.identifier.citation | Voropay, E. S. Methods and apparatus for layerwise atomic emission analysis of materials and products with nanometer resolution / E. S. Voropay, K. F. Ermalitskaia, A. P. Zajogin // Фотоника: наука в производство = Photonics: science into production : сборник материалов белорусско-китайского форума, 12-13 декабря 2013 г. – Minsk : BNTU, 2013. – С. 52-56. | ru |
| dc.identifier.uri | https://rep.bntu.by/handle/data/41592 | |
| dc.language.iso | en | ru |
| dc.publisher | BNTU | ru |
| dc.title | Methods and apparatus for layerwise atomic emission analysis of materials and products with nanometer resolution | ru |
| dc.type | Working Paper | ru |
